A few coarse particles in an otherwise much finer sample pose a problem in various applications such as the production of inkjet printing powders or abrasives. However, fast and reliable quantitative detection of such oversized particles is difficult with conventional methods such as laser diffraction, because the few large particles are statistically underrepresented in the measured scattered light spectrum and the subsequent mathematical fitting procedure. In the resulting particle size distribution curve, they are then not present at all or only in too small a proportion. In the article it is shown how a synchronous measurement of the sample with laser diffraction and dynamic image analysis is performed in the Bettersizer S3 Plus and how it solves the problem.

Do you have questions? Contact us:

+49 8134 9324 0
 info@3P-instruments.com

Do you like our News?

Follow us: