Brochure Bettersizer S 3 Plus
With its unique and innovative design, the Bettersizer S3 Plus combines the measurement methods of static light scattering and dynamic image analysis, thus offering a universal option for characterizing size and shape of particles from the nanometer to the millimeter range.
Using the patented DLOIOS technology, even nanoparticles (from 10 nm onward) can reliably be characterized. The additional lens between the laser and the measurement chamber enables the detection of the backscattered light. The use of only one laser with oblique incidence of light provides a continuous scattering spectrum with consistent wavelength and allows the detection in a continuous angle range up to 165°.
Since the maximal intensity of the scattered light of large particles can only be detected at very small angles, the classical static light scattering cannot analyze those particles sufficient enough. The image analysis system of the Bettersizer S3 Plus enables, in contrast to other laser diffraction systems, the reliable detection of larger particles thanks to particle detection by camera and thus allows realistic measurements up to 3.5 mm.
Thanks to the implemented dynamic image analysis, the most important shape parameters can be calculated from the individual particle images – aspect ratio, circularity, sharpness of edges, and others.
The shape analysis can be carried out simultaneously with the size analysis or independently. Thereby you can choose between two magnifications for image collection (0.5X and 10X).
Bettersizer S3 Plus – Scheme of Optical Bench
/1/ ISO 13320 Particle size analysis – Laser diffraction methods
/2/ ISO 13322-2: Particle size analysis – Image analysis methods – Part 2: Dynamic image analysis methods
/3/ ISO 9276-6 Representation of results of particle size analysis – Part 6: Descriptive and quantitative representation of particle shape and morphology
/4/ PARTICLE WORLD 19; p. 4 – 7; “<<The next generation>> in particle measurement: the combination of static light scattering and dynamic image analysis: BETTERSIZER S3 Plus”
/5/ CIT (Chemie Ingenieur Technik) 4/2018; “Exakte Partikelgrößen- und Formanalyse in einem Messgerät: Kombination statischer Lichtstreuung und dynamischer Bildanalyse” [available only in German]
/6/ Verfahrenstechnik.de, 08/2019, Pressemitteilung: https://www.verfahrenstechnik.de/partikelanalysesystem-besteht-ringversuch/ [available only in German]
/7/ Labo.de, 08/2019, Pressemitteilung: https://www.labo.de/optische-analysengeraete/bettersizer-s3-plus-besteht-erfolgreich-ringversuch-der-bam.htm [available only in German]
/8/ Particle World 20; p. 6-15; “The Bettersizer S3 Plus for particle size analysis – From Gustav Mie to the latest generation of laser diffraction devices”
/9/ CIT (Chemie Ingenieur Technik) 6/2020; „Untersuchung der partikulären Eigenschaften von Sanden hinsichtlich der Eignung zur Betonproduktion“ [available only in German]
With the solvent resistance option and the additional dispersion unit BT-800N, measurements can be performed in all common solvents on the Bettersizer S3 Plus. The reduced bath volume compared to the standard dispersing unit enables economical use of solvents, the modular design of the measuring system and the self-sufficient operation of the dispersing unit BT-800N guarantees a quick and easy exchange of the dispersing modules without inconvenient cleaning or further modifications to hardware and software. Analogous to the standard dispersion, a visible sample preparation by stirring and ultrasonic is possible.
The external small-volume cell is ideally suitable for reproducible particle size measurement in polar and non-polar solvents. Due to the small amount of liquid, solvent consumption is low. The effective and controllable ultrasonic irradiation enables the measurement of systems that are difficult to disperse or tend to reagglomeration.
Cleaning and changing samples or solvents is very easy thanks to the quick release system. The sample feed to the Bettersizer S3 Plus is carried out via a solvent-resistant hose and is manually controlled.
|Bettersizer S3||Static light scattering 0.01 – 3500 µm|
|Bettersizer 2600||Static light scattering 0.02 – 2600 µm|
|Bettersizer ST||Static Light Scattering 0.1 – 1000 µm|
|Nanoptic 90||Dynamic light scattering 1 nm – 9.5 µm|
|BeVision D2||Dynamic image analysis 2 µm – 10000 µm|
|DT-100||Acoustic attenuation spectroscopy 5 nm – 1000 µm|
|DT-1202||Acoustic attenuation spectroscopy 5 nm – 1000 µm|